Material | UVFS |
Surface quality | 40-20 scratch & dig (MIL-PRF-13830B) |
Clear aperture | 90% of the diameter |
Diameter tolerance | +0.00, -0.12 mm |
Thickness tolerance | ±0.2 mm |
Surface irregularity | λ/8 @ 633 nm |
Concentricity | 3 arcmin |
Paraxial focal length | ±2% @ 800 nm |
COATING
Technology | Electron beam multilayer dielectric or IBS |
Adhesion and Durability | Per MIL-C-675A. Insoluble in lab solvents |
Clear Aperture | Exceeds central 85% of diameter |
Damage Threshold | 100 mJ/cm2, 50 fsec pulse, 100 Hz, 1030 nm typical |
Angle of incidence | 0° |
EKSMA Optics Femtoline Thin Lenses
90.14 kB |
Femtoline Thin AR coated at 1000-1060 nm Lenses for applications with femtosecond Ti:Sapphire laser pulses. Presented lenses ensure low Group Delay Dispersion of broadband femtosecond Ti:Sapphire laser pulses.