| Material | UVFS |
| Surface quality | 40-20 scratch & dig (MIL-PRF-13830B) |
| Clear aperture | 90% of the diameter |
| Diameter tolerance | +0.00, -0.12 mm |
| Thickness tolerance | ±0.2 mm |
| Surface irregularity | λ/8 @ 633 nm |
| Concentricity | 3 arcmin |
| Paraxial focal length | ±2% @ 800 nm |
COATING
| Technology | Electron beam multilayer dielectric or IBS |
| Adhesion and Durability | Per MIL-C-675A. Insoluble in lab solvents |
| Clear Aperture | Exceeds central 85% of diameter |
| Damage Threshold | 100 mJ/cm2, 50 fsec pulse, 100 Hz, 1030 nm typical |
| Angle of incidence | 0° |
| EKSMA Optics Femtoline Thin Lenses
90.14 kB |
Femtoline Thin AR coated at 1000-1060 nm Lenses for applications with femtosecond Ti:Sapphire laser pulses. Presented lenses ensure low Group Delay Dispersion of broadband femtosecond Ti:Sapphire laser pulses.